| Customization: | Available |
|---|---|
| Application: | Semi Standard |
| Material: | Compound Semiconductor |
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Use Reference Value for Specifications
| Item | Specification | ||
| Diameter | 150mm | 200mm | 300mm |
| Type | P/N | P/N | P/N |
| Notch | SEMI/JEIDA | Notch/OF | Notch |
| Thickness(μm) | 675±25/625±25 | 725±25 | 725±25 |
| Surface | Polished | Polished | Polished |
| Inside | Etched | Etched | Etched |
| Package | CoinRoll | CoinRoll | CoinRoll |
150MM/200MM Test Wafer - Precision for Critical Testing
| 150MM | ||
| SPEC | 0.2um≤30ea | |
| Diameter(mm) | 150±0.2mm | |
| Type | P | |
| Olyfra length | 57.5mm±2.5mm | 47.5mm±2.5mm |
| Resistance value ( Ω·cm ) | 1-100 | |
| Thickness(μm) | SEMI | JEIDA |
| 675um±25um | 675um±25um | |
| TTV(μm) | ≤30um | |
| BOW(μm) | ≤40um | |
| WARP(μm) | ≤40um | |
| Surface impurity | ≤5.0E 10 atom/cm² | |
| 200MM | ||
| SPEC | 0.2um≤30ea | - |
| Diameter(mm) | 200±0.2mm | |
| Type | P | |
| Crystal orientation | <110>±1 | |
| Notch direction | ||
| Resistance value ( Ω·cm ) | 1-100 | |
| Thickness(μm) | 725um±25um | |
| TTV(μm) | ≤25um | ≤2um |
| BOW(μm) | ≤40um | |
| WARP(μm) | ||
| LM | NO | |
| Surface impurity | ≤5.0E 10 atom/cm² | |
| 300MM | ||||
| SPEC | 0.045um≤50ea | 0.065um≤50ea | 0.09um<50ea | 0.12um<50ea |
| Manufacturing method | CZ | |||
| Diameter(mm) | 300±0.2mm | |||
| Type/Dopant | P/Boron | |||
| Crystal orientation | <100>±1 | |||
| Notch direction | ||||
| Resistance value (Ω·cm) | 1-100 | |||
| Thickness(μm) | 775±25 | |||
| TTV(μm) | ≤10 | |||
| BOW(μm) | ≤40 | |||
| WARP(μm) | ||||
| LM | T7+ OCR | |||
| Surface impurity | <1 E10 Atoms/cm² | |||
| 200MM | 300MM | |
| Oxide thickness | 500±25nm | |
| Variation in oxide thickness (for one wafer) |
<3% | |
| Variation in oxide thickness (for multiple wafers) |
<3% | |
| SPEC | 0.2μm≤30ea | |
| Diameter(mm) | 200±0.2mm | 300±0.2mm |
| Type | P | |
| Crystal orientation | <100>±1 | |
| Notch direction | <100>±1 | |
| Resistance value (Ω ·cm) | 1-100 | |
| Thickness(μm) | 725±25 | |
| TTV(μm) | ≤25 | ≤10 |
| BOW(μm) | ≤40 | |
| WARP(μm) | ≤40 | |
| Surface impurity | ≤5.0 E10 Atom/cm² | <1 E10 Atoms/cm² |
At Fine Silicon Manufacturing (Shanghai) Ltd., we offer the highest quality silicon wafers at competitive prices. Silicon wafers are the cornerstone of today's semiconductor industry. Our WaferPro silicon wafers provide an exceptional balance of cost efficiency and performance.
Whether you're in need of silicon wafers for immediate purchase or looking to buy silicon wafers online, our extensive in-stock inventory includes SEMI standard silicon wafers in diameters of 2", 3", 100mm, 125mm, 150mm, 200mm, and 300mm, all ready for prompt shipping.
For custom wafer sizes or specifications beyond our standard online offerings, reach out to our expert team to meet your unique semiconductor wafer needs by leveraging our comprehensive supply chain partnerships.
Q: What's the way of shipping?
A: We offer a variety of reliable shipping options, including DHL, FedEx, ***, UPS, EMS, and SF, among others.
Q: How can I make a payment?
A: We accept payments via T/T (Telegraphic Transfer) and PayPal.and other methods.
Q: What's the delivery time?
A: For in-stock items, the delivery time is typically 5 working days.
For customized products, the delivery timeline ranges from 7 to 25 working days, depending on the order quantity.
Q: Can I customize the products to meet my specific needs?
A: Yes, we offer customization for materials, specifications, and optical coatings to suit your unique requirements.
Each customer's specifications are unique, and Fine Silicon Manufacturing (Shanghai) Ltd. can supply wafers that precisely match your needs.
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